Maxim

Description

Page 1. Calculation of Semiconductor Failure Rates. William J. Vigrass. One of the fundamentals of understanding a products reliability requires an understanding of the calculation of the failure rate. The traditional method of determining CD74HC4066M96. S. SOIC. 14. 74HC4066N. NXP Semiconductor. CD74HC4066E. S. PDIP. 14. 74HC4066PW . NXP Semiconductor. CD74HC4066PW. S. TSSOP. 14. 74HC4066PW -T. NXP Semiconductor. CD74HC4066PWR. S. TSSOP. H. 10. 1 toestemming van de auteursrechthebbende. A. * 16 Bit. G. 7. 8. 9. 10. IP16. 2P82. 100n. FP23. 3P85. 100R. 71. 4. 1. 2. 2K2. 3P81. 74HC4066PW . 7P15-1. 13. 10K. 3P80. 100R. 3P84. 9P41. RES. 3P36. 10K. 10. +3V3-STANDBY . 9P19. 3P38 100R. 3P37. 100R. 3P06. 100R. 3P36 100R. 3P34 100R. 3P07. 9P26. 9P19. RES. 12. 71. 4. 11. 10. 7P15-4. 74HC4066PW . 9P24. +3V3. 71. 4. 1. 2. 100n. 2P35. 7P15-1. 74HC4066PW . 13. 5. 100R. 3P85. 1P02. B3B-PH-SM4-TBT (LF).